AFM is particularly well-suited to working with soft materials in the field of nanomechanical measurements, owing to its piconewton force resolution and sub-nanometer vertical displacement accuracy.

Atomic force microscopy has long relied on the ability to acquire nanoscale chemical information while simultaneously characterizing nanomechanical properties. This article explores a new means of ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

AFM is a scanning probe microscopic instrument that consists of a force-sensing microcantilever, a laser source, a piezoelectric scanner and a photodiode detector (Figure 1A). During AFM imaging, the ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...